Dr.V.Vasanthi Pillay Profile
Physics Department - Faculty

10236

Dr.V.Vasanthi Pillay
Assistant Professor

Qualification:M.Sc., M.Phil., Ph.D.(BDU)

Specialization: Material Science

Phone No:

EmailID:vasanthi.pillay@gitam.edu

More Details

SlnoTitleJournal NameVolumesYear
1 Influence of deposition time on the microstructure and dielectric properties of AIN / Si thin film for enhanced hydrogen sensing application. Microelectronic engineering, 1.38 Volume 113, 2014
2 Effect of rf power on the structural properties of indium tin oxide thin film prepared for application in hydrogen gas sensor. Journal of Materials Science: Materials in Electronics, Springer, 1.9 Volume 24, Issue 6, 2013
3 Microstructural evolution and dielectric properties of 1D AlN powders synthesized by microwave technique. Superlattices and Microstructures, Elsevier,1.564 Volume 51, Issue 6, 2012
4 5. Micro structural evolution of highly a-axis oriented AlN film by d.c.magnetron sputtering International journal of nanotechnology and applications, volume 5 number 3 pp 351-358 2012
5 Micro structural evolution of highly a-axis oriented AlN film by d.c.magnetron sputtering International journal of nanotechnology and applications, volume 5 number 3 pp 351-358 2012
6 Influence of Sputter Deposition Time on the Growth of c-Axis Oriented AlN/Si Thin Films for Microelectronic Application. Journal of minerals and material characterization and engineering, Vol.11 No.7, 0.9 2012
7 Effect of heat treatment on the NO2 sensing properties of sputterdeposited indium tin oxide thin film. Philosophical Magazine Letters, Taylor and Francis,1.3 Volume 91, Issue 10, 2011
8 Influence of deposition parameters and heat treatment on the NO2 Sensing properties of nanostructured indium tin oxide thin film. Thin Solid Films, Elsevier, 1.87 519 (2011) 3378-3382. 2011
9 Influence of deposition parameters and heat treatment on the NO2 Sensing properties of nanostructured indium tin oxide thin film. Thin Solid Films, Elsevier, 1.87 519 (2011) 3378-3382. 2011